What is Silicon Characterization Testing?

Image courtesy: MPI corp

Characterization testing is a type of testing performed on silicon chips and integrated circuits to determine their electrical and performance characteristics. During characterization testing, devices are subjected to a series of tests that measure various electrical parameters, such as voltage, current, and capacitance. The results of these tests are used to create a "characterization" of the device, which includes information about its operating conditions, performance specifications, and electrical parameters.

Characterization testing is an important step in the development and manufacture of silicon chips and integrated circuits, as it helps to ensure that each device is functioning as intended and meets the required specifications. This information is used to optimize the design of the device, to improve its performance, and to identify any potential issues that may impact reliability.

Characterization testing is often performed early in the manufacturing process, before the devices are packaged and assembled into finished products. This helps to catch any defects early, reducing the cost and time required to fix any issues. Additionally, characterization testing is often performed on new and innovative designs, to help validate the design and to provide a basis for comparison to future designs.