Testing
At-Speed and Advanced Fault Models for Achieving High Quality Test
With the increasing clock speeds and the decreasing feature sizes found in today's nanometer designs, at-speed tes…
Testing
Testing
Most Significant Papers on IC Test
Many important papers have been presented at the annual International Test Conference (ITC) over the past 35 years. Th…
Testing
The Economics of Test, Part - IV
Detecting a defective unit is often only part of the job. Another important aspect of test economics that must be consi…
Testing
The Economics of Test, Part - III
However, if devices are tested, feature sizes can be reduced and more die will fit on each wafer. Even after the die ar…
Testing
Some Testing Glossary
Black box testing not based on any knowledge of internal design or code. Tests are based on requirements and functional…
Verification
Verification and Testing
Verification: In order to verify the functional correctness of a design, one needs to capture the model of the behavior…
Testing
Load and stress testing.
One of the most common, but unfortunate misuse of terminology is treating "load testing" and "stress tes…