Showing posts with the label DFT
Debug

IJTAG: A Standard for Accessing Embedded Instruments

byMG - BBC1
DFT

Stuck-at-Fault Model (SAF) and Transition-Delay-Fault Model (TDF) Charatcteristics and Application

byMG - BBC1
At-speed

At-Speed and Advanced Fault Models for Achieving High Quality Test

bymg - BBC1
Black box testing

The Economics of Test, Part - IV

byMG - BBC1
Black box testing

The Economics of Test, Part - III

byMG - BBC1
Black box testing

The Economics of Test, Part - II

byMG - BBC1
Black box testing

The Economics of Test, Part - I

byMG - BBC1
DFT

When are DFT and Formal verification used?

byMG - BBC1
ASIC

Application Specific Integrated Circuit ( ASIC )

byMG - BBC1
That is all