Semiconductors. Chips and Systems. Innovation.

Testing

At-Speed and Advanced Fault Models for Achieving High Quality Test

With the increasing clock speeds and the decreasing feature sizes found in today's nanometer designs, at-speed tes…

Memory Faults

Memories - Memory Faults - Part 4

As memories grow larger, with more memory cells packed into an ever-shrinking die area, the cost to manufacture a die r…