Displaying posts in the categoryBurn-In
Burn-In articles
Photonics
When a pluggable transceiver fails, a technician pulls it from the faceplate and fits another. When an optical engine fails inside a co-packaged switch or accelerator, it can take the whole package with it, including a very expensive piece of silicon that was working perfectly. That one difference explains most of what is unusual about testing co-packaged optics (CPO). The industry's answer is the known good optical engine: prove the engin…
by
Murugavel Ganesan
November 12, 2026
Tutorials
Silicon burn-in testing is a screen in which chips are powered and operated at high temperature and elevated voltage for hours, so that weak parts fail in the factory instead of in a customer's product. It targets infant mortality, the early failures caused by latent manufacturing defects. Parts that survive burn-in and pass a final electrical test are shipped; parts that fail are scrapped, and their failures are analysed to improve the pr…
by
Murugavel Ganesan
February 18, 2023